Speaker
Dr
Martin de Jonge
(Australian Synchrotron)
Description
X-ray Fluorescence Microscopy uses a focussed beam and an energy resolving detector to map trace metals at exquisite sensitivity and resolution for a broad diversity of research programmes. Our possession of the Maia detector enables us to acquire high-sensitivity data at incredible pixel rates, and this in turn has enabled higher-dimensional techniques, such as fluorescence tomography, XANES imaging, and XANES-tomography. The beamline has solid impact, punching well above its weight.
From the beamline’s inception (late 2008) up to May 2015, beamline data acquisition was limited by a range of mechanical and controls parameters, including stage resolution, speed, and acceleration. We have recently completed phase 1 of a project to bring fast scanning to the XFM beamline. The new build substantially improves data acquisition rates and accuracy, and frees limitations on the measurement parameter-space, enabling a range of entirely new investigations. Here we report on the design, build, and testing of the updated stages, and discuss a range of further improvements that will make this an optimised workhorse of the XFM beamline. We welcome feedback about the future capabilities of the equipment from the user community.
Primary author
Dr
Martin de Jonge
(Australian Synchrotron)
Co-authors
Mr
Adam Michalczyk
(Australian Synchrotron)
Adam Walsh
(Australian Synchrotron)
Andrew Faulks
(CSIRO)
Andrew Starritt
(Australian Synchrotron)
Dr
Chris Ryan
(CSIRO)
Daryl Howard
(Australian Synchrotron)
David Paterson
(Australian Synchrotron)
Ms
Emma Shepherd
(Australian Synchrotron)
Mr
Macleay Stephenson
(Australian Synchrotron)
Mr
Nader Afshar
(Controls Engineer)
Mr
Noel Basten
(Australian Synchrotron)
Mr
Robin Kirkham
(CSIRO)