Speaker
Dr
Matthew Rowles
(Curtin University)
Description
*In situ* X-ray diffraction is a common technique for observing and determining structural transitions in crystalline materials with changes in temperature, pH, pressure, or some other driving force. In the analysis of metal hydride systems, there can be structural transitions composed of multiple phases forming and decomposing simultaneously. These patterns are often overshadowed by high intensity peaks, leaving the subtle phase transitions undetected by conventional automated techniques. We are developing an automated method based on wavelet peak identification and diffraction pattern derivatives to separate and identify these subtle phase transitions. The method will include peak-to-phase assignment and possibly indexing.
Keywords | diffraction; peak identification; phase transformation; automation; in situ |
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Primary author
Dr
Matthew Rowles
(Curtin University)
Co-authors
Prof.
Craig Buckley
(Curtin University)
Dr
Drew Sheppard
(Curtin University)
Dr
Terry Humphries
(Curtin University)