25-27 November 2015
National Centre for Synchrotron Science
Australia/Melbourne timezone

Technique for the Identification of Phases and Phase Transformations in In Situ Diffraction Data

27 Nov 2015, 15:05
Conference Rooms ()

Conference Rooms

Oral Beamlines, Instrumentation and Techniques Techniques II


Dr Matthew Rowles (Curtin University)


*In situ* X-ray diffraction is a common technique for observing and determining structural transitions in crystalline materials with changes in temperature, pH, pressure, or some other driving force. In the analysis of metal hydride systems, there can be structural transitions composed of multiple phases forming and decomposing simultaneously. These patterns are often overshadowed by high intensity peaks, leaving the subtle phase transitions undetected by conventional automated techniques. We are developing an automated method based on wavelet peak identification and diffraction pattern derivatives to separate and identify these subtle phase transitions. The method will include peak-to-phase assignment and possibly indexing.
Keywords diffraction; peak identification; phase transformation; automation; in situ

Primary author

Dr Matthew Rowles (Curtin University)


Prof. Craig Buckley (Curtin University) Dr Drew Sheppard (Curtin University) Dr Terry Humphries (Curtin University)

Presentation Materials

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