Speaker
Mr
Nader Afshar
(Controls Engineer)
Description
Data acquisition at virtually every beamline at the AS involves scanning; however, none more so than the XFM beamline, where every pixel in an image is acquired serially by scanning a specimen through a tightly-focused beam. At XFM, faster scanning means more science.
On-the-fly scanning has significantly improved scan speeds by removing overheads between pixels. However, developments in the past 15 years now require optimisation of the entire scan motion as a sequence of line scans.
We have developed an approach which breaks the motion profile into two components, being a 'measurement motion' (‘scan’ moves), connected by 'transition motion' (‘skip’ moves). The Skip-Scan approach provides an efficient platform for implementation of generalised on-the-fly scans that are fully optimised for accuracy and speed. This approach is used for implementation of optimised raster scans at XFM.
| Keywords or phrases (comma separated) | XFM, fly-scan, raster scan |
|---|---|
| Do you wish to take part in</br>the Student Poster Slam? | No |
| Are you an ECR? (<5 yrs</br>since PhD/Masters) | No |
| What is your gender? | Male |
| Are you a student? | No |
Primary author
Mr
Nader Afshar
(Controls Engineer)
Co-authors
Dr
Daryl Howard
(Australian Synchrotron)
David Paterson
(Australian Synchrotron)
Dr
Martin de Jonge
(Australian Synchrotron)
Dr
Michael Jones
(Australian Synchrotron)
