Speaker
Description
Current applications of X-ray Absorption Fine Structure (XAFS) to low absorbing samples such as ultra-thin films in semiconductor and nano-devices have been limited. This is expected to not be the case for the phase component of the fine structure as it is generally orders of magnitude larger than the absorption component in the x-ray regime. Here, we present details of precision measurements of both the phase and absorption components of the atomic fine structure across the K-edge of thin copper and iron foils. The experiments applied Fourier Transform Holography with an extended reference in spectroscopy mode and were conducted at the XFM and the SAXS/WAXS beamlines of the Australian Synchrotron. The results provide critical experimental benchmark for further theoretical development and has potential to delve into the phase equivalent of XAFS related techniques.
| Condition of submission | Yes |
|---|---|
| Level of Expertise | Student |
| Students Only - Are you interested in AINSE student funding | Yes |
| Presenter Gender | Man |
| Do you wish to take part in the Student Poster Slam | No |
| Which facility did you use for your research | Australian Synchrotron |
