Speaker
Description
The Australian Synchrotron X-ray Fluorescence Microscopy (XFM) beamline has recently implemented fast-scanning ptychography, a scanning X-ray diffraction microscopy method. Ptychography creates super-resolution images from transmitted microdiffraction patterns acquired as the sample is scanned through the beam. High-speed detectors and high-performance computers are required to iteratively reconstruct these complex images. The experimental methods and reconstruction algorithms have significantly evolved over the last decade and a half into a mature and user-friendly complementary imaging method to XFM.
Here we present the implementation of high speed ptychography at the XFM beamline, which includes a free-run data collection mode where detector dead time is eliminated, and the scan time is optimized. We show that free-run data collection is viable for fast and high-quality ptychography by demonstrating extremely high data rate acquisition covering areas up to 352,000 µm2 at up to 140 µm2/s, with 18× spatial resolution enhancement compared to the beam size. With these improvements, ptychography at velocities up to 250 µm/s is approaching speeds compatible with fast-scanning X-ray fluorescence microscopy. The combination of these methods provides morphological context for elemental and chemical information, enabling unique scientific outcomes.
| Which facility did you use for your research | Australian Synchrotron |
|---|---|
| Level of Expertise | Expert |
| Presenter Gender | Man |
| Condition of submission | Yes |
