Learning objectives

Upon competition of this workshop attendees should be able to:

  • Understand the basics of powder diffraction
  • Understand the different information content of a power diffraction pattern and their physical meaning, including peak position, peak intensity, and peak profile
  • Identify symmetry operations and elements in structures, and understand the differences between crystal systems
  • Index the powder diffraction pattern of a simple unknown phase
  • Accurately identify the phases in a mixture of unknown phases
  • Refine the wavelength of a standard sample measured using X-rays and neutrons
  • Carry out accurate LeBail/Pawley and Rietveld refinements measured using X-rays and neutrons
  • Visually interpret the quality of a model fit to the data and identify areas for improvement
  • Find reliable powder diffraction resources to self-learn and develop your own skills

This workshop is not intended to teach you how to use TOPAS or GSAS-II packages, or how to carry out a full analysis of your specific material.

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