Speaker
Simin Chen
(ANSTO)
Description
The fast ORM measurement system would be capable of reducing the measurement time of the storage ring’s corrector to position response matrix from 15 minutes down to around 1 minute.
The fast ORM measurement system is designed to generate sinusoidal excitation of the electron beam with or without FOFB correction data for fast response measurements. It is also equipped with a white noise generator for closed loop gain analysis. With a much larger FPGA, the FOFB correction data can be encoded as UDP packets and sent to IOCs for archiving and offline analysis.
Primary authors
Simin Chen
(ANSTO)
Eugene Tan
(Australian Synchrotron)
