Speaker
Tony Kirk
(La Trobe University)
Description
Current applications of X-ray Absorption Fine Structure to low absorbing samples such as ultra-thin films in semiconductor and nano-devices have been limited. This is not the case for the phase component of the fine structure as it is generally orders of magnitude larger than the absorption component in the x-ray regime. We will present a technical methodology to retrieve the phase and absorption components of a copper thin film simultaneously at the XFM beamline (Australian Synchrotron) by applying the HERALDO technique across the copper K-edge. The results provide critical experimental benchmark for further theoretical development and has potential to delve into the phase equivalent of the XAFS technique.
| Do yo wish to take part in the poster slam | Yes |
|---|---|
| Speakers Gender | Male |
| Travel Funding | Yes |
| Level of Expertise | Student |
Primary authors
Dr
Chanh Tran
(La Trobe University)
Tony Kirk
(La Trobe University)
Co-authors
Mr
Anirudh Jallandhra
(RMIT)
Cameron Kewish
(Australian Synchrotron)
Christopher Thomas Chantler
(University of Melbourne)
David Paterson
(Australian Synchrotron)
Eugeniu Balaur
(La Trobe University)
Gerard Hinsley
Grant van Riessen
(La Trobe University)
Mr
Julian Ceddia
(La Trobe University)
Juliane Reinhardt
Martin de Jonge
Mr
Minh Dao
(La Trobe University)
Mr
Paul Di Pasquale
(La Trobe University)
Prof.
Zwi Barnea
(Melbourne University)
