Speakers
Description
With increased interest in Sn-Bi based low temperature solder alloys in electronic packaging industries, understanding the changes of the microstructure during heating is essential for improving reliability and enabling wider application. In this study, in-situ heating synchrotron powder X-ray diffraction (PXRD) was adopted to investigate the change in lattice parameters of the Sn and Bi phases in a Sn-37wt%Bi alloy during heating. The results revealed that the change in lattice parameters of Sn and Bi depend not only on temperature but also the concentration of Bi in Sn and Sn in Bi. These results indicate significant changes in the microstructure during heating. In-situ scanning electron microscopy (SEM) with a heating stage was used to investigate how the microstructure of Sn-37wt%Bi develops at different temperatures. The results provide a deep insight into the changes in crystal structure and microstructure of Sn-Bi based solder alloys during thermal cycling in a temperature range relevant to service conditions in electronic devices.
| Do you intend to attend UM2022 | Unsure at this stage |
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| Terms and conditions (Please confirm that you have read all the requirements and agree to the conditions) | Yes |
| Pronouns | He/Him |
| Students Only - if available would you be interested in student travel funding | Yes |
| Students Only – Do you wish to take part in the Student Poster Slam | Yes |
| Presenter Gender | Man |
| Level of Expertise | Student |
