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SUMMARY:Chain alignment and charge transport anisotropy in blade-coated N2
 200/PS blend films
DTSTART;VALUE=DATE-TIME:20211125T065100Z
DTEND;VALUE=DATE-TIME:20211125T065200Z
DTSTAMP;VALUE=DATE-TIME:20260718T054345Z
UID:indico-contribution-4195@events01.synchrotron.org.au
DESCRIPTION:Speakers: Lin-jing Tang (Monash University)\nSemiconducting po
 lymers offer the potential of low-cost flexible electronics. To improve th
 e processability and mechanical flexibility of semiconducting polymers\, b
 lending with commodity polymers is an attractive strategy. Understanding h
 ow blending affects the resulting microstructure in aligned samples produc
 ed by directional coating techniques such as blade coating is important to
  optimize device performance. This presentation will discuss the microstru
 cture of blade-coated blends of the semiconducting polymer N2200 with poly
 styrene (PS) using a range of techniques. In particular\, we have investig
 ated the degree of alignment of chains of the semiconducting polymer N2200
  at the surface and in the bulk. UV-vis spectroscopy and surface-sensitive
  NEXAFS spectroscopy show that blade coating induces the preferential orie
 ntation of N2200 chains parallel to the coating direction. Angle-dependent
  NEXAFS enables the averaged tilt angle of the planar backbone of N2200 to
  be determined\, revealing improved edge-on configuration at the surface w
 ith reduced N2200 content. By deconvoluting the spectra of N2200/PS blend 
 film\, the concentration of N2200 at the surface was determined\, showing 
 its tendency of segregating at the surface. Another synchrotron-based tech
 nique\, grazing-incidence wide-angle X-ray scattering (GIWAXS) was used to
  selectively probe the crystalline phase of N2200. The GIWAXS results conf
 irm the directional alignment of N2200 crystallites with backbone stacking
  direction to be parallel to the coating direction. From the analysis of c
 rystallite orientation (texture)\, a transition from preferential face-on 
 orientation to edge-on orientation at low N2200 content was seen. Finally\
 , charge transport anisotropy was investigated by measuring organic field-
 effect transistors based on blade-coated N2200/PS blend films with conduct
 ive channel length parallel or perpendicular to the coating direction.\n\n
 https://events01.synchrotron.org.au/event/146/contributions/4195/
LOCATION:Online
URL:https://events01.synchrotron.org.au/event/146/contributions/4195/
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